K Longest Paths Per Gate (KLPG) Test Generation for Scan-Based Sequential Circuits

Authors:
Wangqi Qiu;Jing Wang;D. M. H. Walker;Divya Reddy;Zhuo Li;Weiping Shi;Hari Balachandran
Affiliations:
Texas A&M University, College Station, TX;Texas A&M University, College Station, TX;Texas A&M University, College Station, TX;Texas Instruments, Inc.;Dept. of Electrical Engineering, Texas A&M University, College Station, TX;Dept. of Electrical Engineering, Texas A&M University, College Station, TX;Texas Instruments, Inc.
Venue:
ITC '04 Proceedings of the International Test Conference on International Test Conference
Year:
2004

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Abstract

To detect the smallest delay faults at a fault site, the longest path(s) through it must be tested at full speed. Existing test generation tools are inefficient in automatically identifying the longest testable paths due to the high computational complexity. In this work a test generation methodology for scan-based synchronous sequential circuits is presented, under two at-speed test strategies used in industry. The two strategies are compared and the test generation efficiency is evaluated on ISCAS89 benchmark circuits and industrial designs. Experiments show that testing transition faults through the longest paths can be done in reasonable test set size.