Optimal Zero-Aliasing Space Compaction of Test Responses

Authors:
Krishnendu Chakrabarty;Brian T. Murray;John P. Hayes
Affiliations:
Duke Univ., Durham, NC;General Motors, Warren, MI;Univ. of Michigan, Ann Arbor
Venue:
IEEE Transactions on Computers
Year:
1998

Citing 15
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Abstract

Many built-in self-testing (BIST) schemes compress the test responses from a k-output circuit to q signature streams, where q 1.