System-level performance evaluation of three-dimensional integrated circuits

  • Authors:
  • Arifur Rahman;Rafael Reif

  • Affiliations:
  • MIT, Cambridge, MA;MIT, Cambridge, MA

  • Venue:
  • IEEE Transactions on Very Large Scale Integration (VLSI) Systems - Special issue on system-level interconnect prediction
  • Year:
  • 2000

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Abstract

In this paper, the wire (interconnect)-length distribution of three-dimensional (3-D) integrated circuits (ICs) is derived using Rent's rule and following the methodology used to estimate two-dimensional (2-D) (wire-length distribution). Two limiting cases of connectivity between logic gates on different device layers are examined by comparing the wire-length distribution and average and total wire-length. System performance metrics such as clock frequency, chip area, etc., are estimated using wire-length distribution, interconnect delay criteria, and simple models representing the cost or complexity for manufacturing 3-D ICs. The technology requirement for interconnects in 3-D integration is also discussed.