Leakage control with efficient use of transistor stacks in single threshold CMOS

  • Authors:
  • Mark C. Johnson;Dinesh Somasekhar;Kaushik Roy

  • Affiliations:
  • Rose-Hulman Institute of Technology, 5500 Wabash Avenue, Terre Haute, IN;Purdue University, 1285 EE Building, West Lafayette, IN;Purdue University, 1285 EE Building, West Lafayette, IN

  • Venue:
  • Proceedings of the 36th annual ACM/IEEE Design Automation Conference
  • Year:
  • 1999

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Abstract