Optimal Core Wrapper Width Selection and SOC Test Scheduling Based on 3-D Bin Packing Algorithm

Authors:
Yu Huang;Sudhakar M. Reddy;Wu-Tung Cheng;Paul Reuter;Nilanjan Mukherjee;Chien-Chung Tsai;Omer Samman;Yahya Zaidan
Affiliations:
-;-;-;-;-;-;-;-
Venue:
ITC '02 Proceedings of the 2002 IEEE International Test Conference
Year:
2002

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Abstract

This paper presents a method to consider a given SOC with pin and peak power constraints, and simultaneously (1) determine an optimal wrapper width for each core, (2) allocate SOC pins to cores and (3) schedule core tests to minimize the test completion time. For the first time the stated problem is formulated as a restricted 3-dimensional bin-packing problem and a heuristic to determine an optimal solution is proposed.