Pre-layout wire length and congestion estimation

  • Authors:
  • Qinghua Liu;Malgorzata Marek-Sadowska

  • Affiliations:
  • University of California, Santa Barbara, CA;University of California, Santa Barbara, CA

  • Venue:
  • Proceedings of the 41st annual Design Automation Conference
  • Year:
  • 2004

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Abstract

In this paper, we study the pre-layout wire length and congestion estimation. We find that two structural metrics, mutual contraction and net range, can be used to predict wire lengths. These metrics have different application ranges and complement each other. We also propose a new metric, the structural pin density, to capture the peak routing congestion of designs. Larger maximum pin densities usually lead to larger peak congestions in circuits with similar average congestions. We demonstrate experimentally very good correlation of our pre-layout measures with post layout interconnect lengths. We also isolate the structural netlist properties which cause the peak congestion.