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We present techniques for design and formal verification of both safety and liveness of pipelined/superscalar/VLIW processors with built-in mechanisms for soft-error tolerance. The formal verification is done with the highly automatic method of Correspondence Checking by exploiting the property of Positive Equality and efficient translations of the correctness conditions to equivalent Boolean formulas that are evaluated with SAT solvers. Soft errors are caused by radiation and cross talk between devices or wires on the chip, and will become increasingly frequent with the decreasing transistor sizes in future technologies. Soft errors can cause catastrophic failures in safety-critical applications, such as space, avionics, weapons systems, automotive, and medical devices. Thus, the need to design and efficiently formally verify pipelined microprocessors with mechanisms for soft-error tolerance.