Error diagnosis for transistor-level verification

  • Authors:
  • Andreas Kuehlmann;David I. Cheng;Arvind Srinivasan;David P. LaPotin

  • Affiliations:
  • IBM Thomas J. Watson Research Center, Yorktown Heights, N.Y.;Dept. of Electrical and Computer Engineering, University of California, Santa Barbara, C.A.;IBM Thomas J. Watson Research Center, Yorktown Heights, N.Y.;IBM Thomas J. Watson Research Center, Yorktown Heights, N.Y.

  • Venue:
  • DAC '94 Proceedings of the 31st annual Design Automation Conference
  • Year:
  • 1994

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Abstract