Analysis of performance impact caused by power supply noise in deep submicron devices

  • Authors:
  • Yi-Min Jiang;Kwang-Ting Cheng

  • Affiliations:
  • Department of Electrical & Computer Engineering, University of California, Santa Barbara, CA;Department of Electrical & Computer Engineering, University of California, Santa Barbara, CA

  • Venue:
  • Proceedings of the 36th annual ACM/IEEE Design Automation Conference
  • Year:
  • 1999

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Abstract