On thermal effects in deep sub-micron VLSI interconnects

  • Authors:
  • Kaustav Banerjee;Amit Mehrotra;Alberto Sangiovanni-Vincentelli;Chenming Hu

  • Affiliations:
  • Integrated Systems, Department of Electrical Engineering, Stanford University, Stanford, CA and Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, CA;Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, CA;Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, CA;Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, CA

  • Venue:
  • Proceedings of the 36th annual ACM/IEEE Design Automation Conference
  • Year:
  • 1999

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Abstract